SensLs Ultra-Low Noise Silicon Photomultipliers

18 / 02 / 2015

Science and Technology Complex Azimut Photonics ZAO, Russias distributor of electro-optical components, different detectors, light sensors, and laser diodes made by leading global manufacturers, invites you to attend Stand 322 at the Photonics. World of Lasers and Optics 2015 exhibition and learn about its new product that is SensLs silicon photomultipliers (SiPM).

SensL, based in Ireland, started production of the next generation ultra-low noise C-Series SiPM. Starting from 2010 it is the 4th generation of commercial SensLs SiPM featuring industry-leading low dark count rates of <100 kHz/mm2 (typically 30 kHz/mm2) in combination with exceptional breakdown voltage uniformity of 250 mV.

The spectral range of C-Series MicroSC/FC sensors is 300nm 800nm with high photon detection efficiency (>40% PDE at 420nm) which extends far into the blue part of the spectrum. Apart from high quantum efficiency C-Series MicroFS sensors have a uniquely fast output.

SensL offers C-Series MicroSC/FC sensors, which are available in 1mm, 3mm and 6mm active detector areas and with microcell sizes 10m, 20m, 35m and 50 m.

C-Series MicroSC/FC sensors can be supplied in different packages: hermetically-sealed metal case TO-18, ceramic package X13, and low cost surface mount package (SMT). Test boards with installed detectors are also available.

C-Series is pin-for-pin compatible with the B-Series except for ultra-low noise. Both series are available in the same packages and at the same price.

C-Series sensors are available in 3mm and 6mm active detector areas from stock in Moscow and can be shipped to a customer within 48 hours.

You can see the samples of SiPM and learn about their specifications if you visit Stand 322 organized by STC Azimut Photonics at Photonics. World of Lasers and Optics 2015. The trade show will run in Pavilion No.3 of Expocentre Fairgrounds (14, Krasnopresnenskaya naberezhnaya, Moscow) on March, 16-19. We will be glad to answer all your questions.

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